2/14/2023 0 Comments High performance probe![]() ![]() (b) inserting each of a plurality of contact probe assemblies so that each passes through a hole in the first retainer, through the space between the first and second retainers, and through a hole in the second retainer, each of the plurality of contact probe assemblies thereby bridging the space between the retainers and (a) attaching first and second insulative retainers to a frame that holds the retainers in a parallel orientation a distance apart from each other, thereby leaving a space between the retainers A method of conveying electrical signals between a test system and a device under test, comprising: The probe interface of claim 1, wherein the first contact pin is coaxially retained within the first conductive tube to maintain a substantially constant characteristic impedance between the first contact pin and the first conductive tube.ġ4. The probe interface of claim 1, wherein the first and second conductive tubes are electrically connected together at their respective first and second ends.ġ3. The probe interface of claim 10, further comprising at least one clip that fastens the contact probe assemblies between the upper and lower retainers.ġ2. The probe interface of claim 1, wherein the contact probe assemblies are separately assembled units that are inserted into the upper and lower retainers only after their assembly is complete.ġ1. The upper and lower insulative retainers and the frame together with their contact probe assemblies form a first sector of a substantially round tester interface,Īnd further comprising a plurality of other sectors substantially identical to the first sector.ġ0. The probe interface of claim 1, further comprising a frame that holds the first and second insulative retainers and maintains the distance between the first and second insulative retainers.ĩ. The probe interface of claim 6, wherein the first and second conductive tubes are connected together by soldering.Ĩ. The probe interface of claim 5, wherein the first contact pin has an outer diameter that is smaller where the first contact pin engages the first and second insulators than it is between the first and second insulators.ħ. The first and second insulators are held in place within the first conductive tube by friction.Ħ. The first spring-loaded probe is held in place within the first and second insulators by friction, and Wherein the first and second insulators retain the first contact probe within the first conductive tube and prevent an electrical connection therebetween.ĥ. The probe interface of claim 2, wherein each of the plurality of contact probe assemblies further comprises:įirst and second substantially annular insulators disposed within the first tubular conductor, the first insulator disposed near a first end of the first conductive tube and the second insulator disposed near a second end of the first conductive tube, The probe interface of claim 2, wherein the second spring-loaded contact pin is held in place within the second conductive tube by friction.Ĥ. The probe interface of claim 1, wherein the second spring-loaded contact pin engages the second conductive tube and makes electrical contact with the second conductive tube.ģ. Upper and lower insulative retainers oriented substantially in parallel and spaced a distance apart from each other, the insulative retainers each having a plurality of holes Ī plurality of contact probe assemblies each engaging one of the plurality of holes in the upper insulative retainer and one of the plurality of holes in the lower insulative retainer and spanning the distance between the retainers, each contact probe assembly includingįirst rigid conductive tube extending from the upper insulative retainer to the lower insulative retainer Ī second rigid conductive tube oriented in parallel with the first conductive tube and electrically connected thereto andįirst and second spring-loaded contact pins respectively passing through the first and second conductive tubes, for passing electrical signals between the tester and the device under test.Ģ. A probe interface for extending a tester interface from a tester to a device under test, comprising:
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